Model-free deflectometry for freeform optics measurement using iterative reconstruction technique

Logan R. Graves (Creator)
Heejoo Choi (Contributor)
Chang Jin Oh (Creator)
Peng Su (ASML Netherlands BV) (Creator)
Tianquan Su (Creator)
Daewook Kim (Creator)
Chang Jin Oh (Creator)

Agriculture and Life Sciences, College of
Optical Sciences
Optical Sciences, College of

Dataset

Description

We present a novel model-free iterative data processing approach which improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface leading to reduced error in the ...

Date made available	2018
Publisher	figshare

DOI
10.6084/m9.figshare.c.4015042

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CC BY 4.0

1 Article

Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique
Graves, L. R., Choi, H., Zhao, W., Oh, C. J. I. N., Su, P., Su, T. & Kim, D. W., May 1 2018, In: Optics letters. 43, 9, p. 2110-2113 4 p.
Research output: Contribution to journal › Article › peer-review
49 Scopus citations

Model-free deflectometry for freeform optics measurement using iterative reconstruction technique

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Research output

Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

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