Engineering
Analog Circuit
7%
Built-in Self Test
32%
Cascode Amplifier
5%
Circuit Design
7%
Combiner
14%
Communication System
5%
Current Injection
5%
Design Complexity
5%
Design Flow
5%
Design Parameter
5%
Design Time
7%
Detection Process
5%
Digital Transmitter
10%
Doherty Power Amplifier
25%
Dynamic Range
10%
Experimental Result
7%
Field Operation
5%
Harmonics
18%
Input Power
7%
Input Signal
16%
Internet of Things
5%
Low Noise Amplifier
6%
Metrics
5%
Millimeter Wave
5%
Nitride
9%
Nodes
8%
Output Power
35%
Performance Degradation
5%
Performance Parameter
8%
Phase Modulator
5%
Power Added Efficiency
13%
Power Amplifier
100%
Power Converter
15%
Power Device
8%
Power Gain
6%
Power Management
5%
Power Supply
6%
Process Variation
15%
Pulse Duration
10%
Quality Control
5%
Radio Frequency
9%
Signal Path
6%
Source Impedance
5%
Statistical Model
5%
Supply Voltage
12%
Test Circuit
6%
Test Time
6%
Transceiver
16%
Transients
10%
V-Band
10%
Keyphrases
Adaptation
5%
All-digital Transmitter (ADTx)
5%
Application-oriented
5%
Built-in-self-test (BiST)
12%
Class-E Power Amplifier
5%
Class-F Power Amplifier
5%
CMOS Integrated
5%
CMOS Op-amp
5%
CMOS Power Amplifier
5%
Common-Drain
5%
Complex Combining Load
5%
Continuous Class-F Mode
5%
Controller
5%
DC to DC Converter
5%
Dynamic Impedance
5%
Envelope Following
10%
Envelope Tracking PA
5%
Fin Field-effect Transistor (FinFET)
5%
Full-duplex Transceiver
5%
GaN Power Device
5%
High Efficiency
10%
Hotspot Detection
5%
Impedance Adjustment
5%
In-field Calibration
5%
Input Power
5%
Integrated Circuits
5%
Integrated Module
5%
Linear Power Amplifier
5%
Millimeter-wave CMOS
5%
Nonlinear Enhancement
5%
On chip
10%
Outphasing Power Amplifier
5%
Outphasing Transmitter
5%
Phase Modulator
5%
Phase Resolution
5%
Phased Array
5%
Post-fabrication Tuning
5%
Power Added Efficiency
5%
Power Amplifier
12%
Power Output
6%
Radiation Hardness
5%
Rapid Synthesis
5%
RF BIST
5%
RF chip
5%
RF Circuits
10%
RF Power Amplifier
5%
Self-Interference Signal
5%
Switch-mode PA
5%
V-band
5%
Zero-IF
5%
