Material Science
Amorphous Material
71%
Amorphous Semiconductor
16%
Amorphous Silicon
65%
Annealing
6%
Carbon Nanotube
32%
Catalyst Support
10%
Crystal Structure
10%
Crystalline Material
41%
Density
27%
Diamond
7%
Diamond Films
9%
Diffraction Pattern
34%
Domain Wall
9%
Electron Diffraction
13%
Electron Microscopy
38%
Electronic Circuit
7%
Epitaxy
6%
Faujasite
9%
Ferroelectric Material
6%
Film
27%
Germanium
23%
Grain Size
5%
Ion Implantation
5%
Lattice Constant
6%
Lineshape
6%
Mechanical Strength
8%
Medium-Range Order
100%
Microscopy
25%
Nanotube
15%
Nucleation
12%
Permittivity
9%
Powder X-Ray Diffraction
6%
Scanning Electron Microscopy
6%
Selected Area Diffraction
5%
Silicon
34%
Silicon Dioxide
17%
Single Crystal
9%
Solution Structure
9%
Structural Relaxation
7%
Superlattice
17%
Surface Active Agent
9%
Surface Imaging
6%
Surface Plasmon
13%
Thin Films
48%
Transmission Electron Microscopy
38%
X-Ray Diffraction
6%
Zeolite
56%
Keyphrases
Amorphous Germanium
13%
Amorphous Materials
11%
Amorphous Semiconductors
8%
Amorphous Silicon
56%
Annealing
8%
Anomalous Transmission
9%
AuSn
9%
Borromean
11%
Borromean Rings
6%
Continuous Random Network
18%
Correlation Length
8%
Diffraction
7%
Diffraction Intensity
6%
Disordered Materials
22%
Doped Diamond Film
9%
Elastic Relaxation
9%
Electron Diffraction
7%
Electron Emission
9%
Faujasite
9%
Flexible Time Windows
9%
Fluctuation Electron Microscopy
22%
Fluctuation Microscopy
45%
Framework Type
9%
Germanium
9%
Hollow Cone
7%
Ion Implantation
10%
Local Structure
9%
Low Energy
11%
Medium-range Order
62%
Microscopic Techniques
9%
Nitrogen-doped Diamond
9%
Palladium Catalyst
9%
Paracrystalline
28%
Periodic Graph
9%
Periodic Knots
6%
Photogenerated Electrons
9%
Photon-enhanced Thermionic Emission
6%
Piecewise-linear Embedding
6%
Semiconductor Model
9%
Silica
9%
Silicon Substrate
6%
Slit Array
9%
Structural Relaxation
7%
Substrate Temperature
9%
Tetrahedral Semiconductors
11%
Transmission Electron Microscopy
10%
Variable Coherence
20%
X-ray Microscopy
6%
Zeolite
21%
Zeolite Framework
13%
Engineering
Aluminum Oxide
6%
Atomic Number
7%
Bragg Reflection
10%
Carbon Nanotube
18%
Catalyst Particle
19%
Correlation Length
22%
Crystal Structure
9%
Crystalline Region
6%
Crystalline Silicon
9%
Defects
6%
Diamond
19%
Disordered Structure
13%
Domain Wall
11%
Double Layer
9%
Elastic Scattering
9%
Electron Diffraction
6%
Electron Emission
9%
Emission Intensity
5%
Energy Dissipation
9%
Energy Engineering
13%
Field Image
12%
Filtration
6%
Ground State
6%
Growth Mechanism
10%
High Resolution
18%
Length Scale
14%
Local Structure
13%
Low-Temperature
6%
Micrograph
9%
Mirror Symmetry
6%
Nanometre
7%
Nanotube
8%
Network Model
6%
Point Spread Function
5%
Pure Silica
7%
Range Order
43%
Scattered Intensity
6%
Silicon Substrate
6%
Slit Array
6%
Space Group
12%
Speckle
11%
Structural Disorder
6%
Supported Catalyst
10%
Surface Plasmon
5%
Thin Films
18%
Thin Foil
6%
Transmissions
52%
Two Dimensional
6%
