Grants per year
Personal profile
Education/Academic qualification
PHD
… → 2002
MS
… → 1999
BE
… → 1995
Fingerprint
Dive into the research topics where Rong Pan is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Network
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Grants
- 12 Finished
-
Location-Aware Influence Maximization
DOD-USAF: Air Force Research Labs (AFRL)
5/9/19 → 12/31/19
Project: Research project
-
Arizona State University: Industral Assessment Center
Villalobos, R., Pan, R., Bliss, D., Phelan, P., Ye, N. & Milcarek, R.
DOE: Office of Energy Efficiency and Renewable Energy (EERE)
9/1/16 → 8/31/21
Project: Research project
-
Correlation of Qualification Testing with Field Degradation
DOE: Office of Energy Efficiency and Renewable Energy (EERE)
8/1/16 → 7/31/18
Project: Research project
-
FY17: Arizona Alzheimer's Consortium Pilot Project - Nonlinear Dimension Reduction for Identifying Biomarkers from Brain Images
Arizona Alzheimer's Consortium
7/1/16 → 6/30/17
Project: Research project
-
SUNY IT Visiting Scholar Program: Detecting communities by sentiment analysis of controversial topics
DOD-USAF: Air Force Research Labs (AFRL)
5/1/15 → 9/30/15
Project: Research project
-
Design strategies and approximation methods for high-performance computing variability management
Wang, Y., Xu, L., Hong, Y., Pan, R., Chang, T., Lux, T., Bernard, J., Watson, L. & Cameron, K., 2023, In: Journal of Quality Technology. 55, 1, p. 88-103 16 p.Research output: Contribution to journal › Article › peer-review
-
Analyzing ALT Data with Time-varying Stress Profile
Pan, R., 2022, 68th Annual Reliability and Maintainability Symposium, RAMS 2022. Institute of Electrical and Electronics Engineers Inc., (Proceedings - Annual Reliability and Maintainability Symposium; vol. 2022-January).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
-
A novel hybrid resampling for semiconductor wafer defect bin classification
Park, Y. J., Pan, R. & Montgomery, D. C., 2022, (Accepted/In press) In: Quality and Reliability Engineering International.Research output: Contribution to journal › Article › peer-review
-
Bayesian D-optimal design for life testing with censoring
Taylor, D., Rigdon, S. E., Pan, R. & Montgomery, D. C., 2022, (Accepted/In press) In: Quality and Reliability Engineering International.Research output: Contribution to journal › Article › peer-review
-
Early Prediction of Lithium-Ion Battery Cycle Life by Machine Learning Methods
Pan, R., 2022, 68th Annual Reliability and Maintainability Symposium, RAMS 2022. Institute of Electrical and Electronics Engineers Inc., (Proceedings - Annual Reliability and Maintainability Symposium; vol. 2022-January).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution