Sort by
Keyphrases
Integrated Circuits
100%
Damage Detection
100%
AIMS™
100%
Detection Method
100%
Nondestructive Evaluation
100%
Intel
100%
Pulsed Thermography
66%
Delamination
66%
Integrated Circuit Package
50%
Integrated Circuit chip
50%
Wave Based Method
16%
Thermographic Method
16%
Ultrasonic Scan
16%
Pulsed Ultrasonic
16%
Collaborative Experiment
16%
Statement of Work
16%
Meaningful Information
16%
Semiconductor Thin Films
16%
Machine Learning Approach
16%
Image Analysis Technique
16%
Proposed Methodology
16%
Induced Defects
16%
Induced Damage
16%
Ultrasonic Guided Waves
16%
Bondline
16%
Effective Tool
16%
Engineering
Damage Detection
100%
Non Destructive Evaluation
100%
Integrated Circuit
100%
Delamination
44%
Ultrasonics
22%
Defects
11%
Bondlines
11%
Induced Damage
11%
Thin Films
11%
Image Analysis
11%
Guided Wave
11%
Learning Approach
11%
Induced Defect
11%