Physics
Point Defect
100%
Dark Current
100%
Electrical Properties
66%
Lattice Mismatch
66%
Transport Property
33%
Backscattering
33%
First Principle
33%
Atomic Force Microscopy
33%
Dielectrics
33%
Infrared Spectra
33%
Defect Passivation
33%
Surface Defect
33%
Optical Properties
33%
Single Crystal
33%
Heterojunctions
33%
Physics
33%
Engineering
Defects
100%
Strain Relaxation
57%
Pilot Program
28%
Lattice Mismatch
28%
Active Layer
14%
Conventional Method
14%
Current Limit
14%
Quantum Mechanical Simulation
14%
Alloy Semiconductor
14%
Dielectrics
14%
Monolithic Integration
14%
Structural Property
14%
Sensing Capability
14%
Critical Thickness
14%
Device Structure
14%
Heterojunctions
14%
Misfit Dislocation
14%
Surface Defect
14%
Monolayer
14%
Team Member
14%
Atomic Force Microscopy
14%
Energy Gap
14%
Device Performance
14%
Si Substrate
14%
Circuit Design
14%
Passivation Layer
14%
Ray Diffraction
14%
Material Science
Silicon
100%
Point Defect
50%
Lattice Mismatch
33%
Electronic Circuit
16%
Structural Property
16%
Monolayers
16%
Surface Defect
16%
Device Fabrication
16%
Heterojunction
16%
Dielectric Material
16%
Optical Property
16%
Ab Initio Simulation
16%
Alloy Semiconductor
16%
Dislocation (Crystal)
16%
Single Crystal
16%
Oxide Compound
16%