A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision

T. Copani; B. Vermeire; A. Jain; H. Karaki; K. Chandrashekar; S. Goswami; Jennifer Kitchen; H. H. Chung; I. Deligoz; Bertan Bakkaloglu; Hugh Barnaby; Sayfe Kiaei

doi:10.1109/CICC.2008.4672096

A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision

T. Copani, B. Vermeire, A. Jain, H. Karaki, K. Chandrashekar, S. Goswami, Jennifer Kitchen, H. H. Chung, I. Deligoz, Bertan Bakkaloglu, Hugh Barnaby, Sayfe Kiaei

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-μm BiCMOS process. The receiver front-end achieves a 2.3GHz bandwidth and NF lower than SdB. The system shows a single-shot precision of 12ps and a measurement range of 188us. The measurement rate can be as high as 700kHz. The power consumption is 148mA from a 3.5V supply for analog and E ²CL circuitry, and a 1.8V supply for CMOS circuitry.

Original language	English (US)
Title of host publication	Proceedings of the Custom Integrated Circuits Conference
Pages	359-362
Number of pages	4
DOIs	https://doi.org/10.1109/CICC.2008.4672096
State	Published - 2008
Event	IEEE 2008 Custom Integrated Circuits Conference, CICC 2008 - San Jose, CA, United States Duration: Sep 21 2008 → Sep 24 2008

Other

Other	IEEE 2008 Custom Integrated Circuits Conference, CICC 2008
Country/Territory	United States
City	San Jose, CA
Period	9/21/08 → 9/24/08

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/CICC.2008.4672096

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Copani, T., Vermeire, B., Jain, A., Karaki, H., Chandrashekar, K., Goswami, S., Kitchen, J., Chung, H. H., Deligoz, I., Bakkaloglu, B., Barnaby, H., & Kiaei, S. (2008). A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision. In Proceedings of the Custom Integrated Circuits Conference (pp. 359-362). Article 4672096 https://doi.org/10.1109/CICC.2008.4672096

Copani, T, Vermeire, B, Jain, A, Karaki, H, Chandrashekar, K, Goswami, S, Kitchen, J, Chung, HH, Deligoz, I, Bakkaloglu, B , Barnaby, H & Kiaei, S 2008, A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision. in Proceedings of the Custom Integrated Circuits Conference., 4672096, pp. 359-362, IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, San Jose, CA, United States, 9/21/08. https://doi.org/10.1109/CICC.2008.4672096

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abstract = "A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-μm BiCMOS process. The receiver front-end achieves a 2.3GHz bandwidth and NF lower than SdB. The system shows a single-shot precision of 12ps and a measurement range of 188us. The measurement rate can be as high as 700kHz. The power consumption is 148mA from a 3.5V supply for analog and E 2CL circuitry, and a 1.8V supply for CMOS circuitry.",

author = "T. Copani and B. Vermeire and A. Jain and H. Karaki and K. Chandrashekar and S. Goswami and Jennifer Kitchen and Chung, {H. H.} and I. Deligoz and Bertan Bakkaloglu and Hugh Barnaby and Sayfe Kiaei",

year = "2008",

doi = "10.1109/CICC.2008.4672096",

language = "English (US)",

pages = "359--362",

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AU - Copani, T.

AU - Vermeire, B.

AU - Jain, A.

AU - Karaki, H.

AU - Chandrashekar, K.

AU - Goswami, S.

AU - Kitchen, Jennifer

AU - Chung, H. H.

AU - Deligoz, I.

AU - Bakkaloglu, Bertan

AU - Barnaby, Hugh

AU - Kiaei, Sayfe

PY - 2008

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N2 - A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-μm BiCMOS process. The receiver front-end achieves a 2.3GHz bandwidth and NF lower than SdB. The system shows a single-shot precision of 12ps and a measurement range of 188us. The measurement rate can be as high as 700kHz. The power consumption is 148mA from a 3.5V supply for analog and E 2CL circuitry, and a 1.8V supply for CMOS circuitry.

AB - A monolithic pulsed time-of-flight measurement system is presented in this paper. The circuit consists of an optical receiver front-end and time-to-digital converter. Received pulse amplitude detectors are also included to correct measurement for walk error. The IC is fabricated in a 0.18-μm BiCMOS process. The receiver front-end achieves a 2.3GHz bandwidth and NF lower than SdB. The system shows a single-shot precision of 12ps and a measurement range of 188us. The measurement rate can be as high as 700kHz. The power consumption is 148mA from a 3.5V supply for analog and E 2CL circuitry, and a 1.8V supply for CMOS circuitry.

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Y2 - 21 September 2008 through 24 September 2008

ER -

A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision

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