A Millimeter-wave kinetic inductance detector camera for long-range imaging through optical obscurants

Jack Sayers, Peter K. Day, Daniel P. Cunnane, Byeong Ho Eom, Henry G. LeDuc, Roger C. O'Brient, Marcus C. Runyan, Sean A. Bryan, Samuel B. Gordon, Philip D. Mauskopf, Bradley R. Johnson, Heather McCarrick, Tanay A. Bhandarkar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


Millimeter-wave imaging provides a promising option for long-range target detection through optical obscurants such as fog, which often occur in marine environments. Given this motivation, we are currently developing a 150 GHz polarization-sensitive imager using a relatively new type of superconducting pair-breaking detector, the kinetic inductance detector (KID). This imager will be paired with a 1.5 m telescope to obtain an angular resolution of 0.09° over a 3.5° field of view using 3,840 KIDs. We have fully characterized a prototype KID array, which shows excellent performance with noise strongly limited by the irreducible fluctuations from the ambient temperature background. Full-scale KID arrays are now being fabricated and characterized for a planned demonstration in a maritime environment later this year.

Original languageEnglish (US)
Title of host publicationPassive and Active Millimeter-Wave Imaging XXIII
EditorsDavid A. Wikner, Duncan A. Robertson
ISBN (Electronic)9781510635999
StatePublished - 2020
EventPassive and Active Millimeter-Wave Imaging XXIII 2020 - None, United States
Duration: Apr 27 2020May 8 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering


ConferencePassive and Active Millimeter-Wave Imaging XXIII 2020
Country/TerritoryUnited States


  • Kinetic Inductance Detectors
  • Millimeter-Wave Imaging
  • Optical Obscurants

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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