A new test stand for dynamically testing coupon samples

Yan Zhang; Tom D. Muster; John Butz; Warren Bletcher

doi:10.1117/12.533129

A new test stand for dynamically testing coupon samples

Yan Zhang, Tom D. Muster, John Butz, Warren Bletcher

Research output: Contribution to journal › Conference article › peer-review

Abstract

A new dynamic test stand is built to test coupon samples for volumetric bit wise optical data storage applications. An unconventional rotating head and fixed sample design is employed. Results from media samples are reported that illustrate pulse-length/power optimization and focus sensitivity. One sample is shown to be appropriate for volumetric applications based in its focus sensitivity.

Original language	English (US)
Pages (from-to)	357-360
Number of pages	4
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5069
DOIs	https://doi.org/10.1117/12.533129
State	Published - 2003
Event	Optical Data Storage 2003 - Vancouver, BC, Canada Duration: May 11 2003 → May 14 2003

Keywords

Dynamic test stand
Volumetric optical data storage

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.533129

Cite this

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title = "A new test stand for dynamically testing coupon samples",

abstract = "A new dynamic test stand is built to test coupon samples for volumetric bit wise optical data storage applications. An unconventional rotating head and fixed sample design is employed. Results from media samples are reported that illustrate pulse-length/power optimization and focus sensitivity. One sample is shown to be appropriate for volumetric applications based in its focus sensitivity.",

keywords = "Dynamic test stand, Volumetric optical data storage",

author = "Yan Zhang and Muster, {Tom D.} and John Butz and Warren Bletcher",

year = "2003",

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language = "English (US)",

volume = "5069",

pages = "357--360",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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AU - Butz, John

AU - Bletcher, Warren

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AB - A new dynamic test stand is built to test coupon samples for volumetric bit wise optical data storage applications. An unconventional rotating head and fixed sample design is employed. Results from media samples are reported that illustrate pulse-length/power optimization and focus sensitivity. One sample is shown to be appropriate for volumetric applications based in its focus sensitivity.

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DO - 10.1117/12.533129

M3 - Conference article

SN - 0277-786X

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JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optical Data Storage 2003

Y2 - 11 May 2003 through 14 May 2003

ER -

A new test stand for dynamically testing coupon samples

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

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