Fingerprint
Dive into the research topics of 'Advanced deflectometry methods for industrial application'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Advanced deflectometry methods for industrial application
Heejoo Choi, Hyukmo Kang, Yiyang Huang, Mina Yoo, Henry Quach, John Kam, Daewook Kim
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution