Abstract
An efficient collector architecture for digital radiographic imaging CdZnTe (CZT) semiconductor sensors was studied. The charge transport characteristics of CZT material were found to be dependent on the charge carriers. The results indicated a improvement of the temporal response of the CdTe (CT) imaging detectors due to the enhanced collection efficiency.
Original language | English (US) |
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Pages | 541-544 |
Number of pages | 4 |
State | Published - 2003 |
Externally published | Yes |
Event | Proceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States Duration: May 20 2003 → May 22 2003 |
Conference
Conference | Proceedings of the 20th IEEE Information and Measurement Technology Conference |
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Country/Territory | United States |
City | Vail, CO |
Period | 5/20/03 → 5/22/03 |
ASJC Scopus subject areas
- Instrumentation