TY - JOUR
T1 - Angle of linear polarization images of outdoor scenes
AU - Kupinski, Meredith
AU - Bradley, Christine
AU - Diner, David
AU - Xu, Feng
AU - Chipman, Russell
N1 - Publisher Copyright: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License.
PY - 2019/8/1
Y1 - 2019/8/1
N2 - Observations from the Ground-based Multiangle SpectroPolarimetric Imager (GroundMSPI) are used to relate angle of linear polarization (AoLP) measurements to material properties and illumination conditions in sunlit outdoor environments. GroundMSPI is a push-broom spectropolarimetric camera with an uncertainty in degree of linear polarization (DoLP) of ±0.005. This polarimetric accuracy yields useful AoLP images even when the DoLP is less than 0.02. AoLP images are reported with respect to dependency on surface texture, surface orientation, albedo, and illumination conditions. Agreement with well-known principles of polarized light scattering is illustrated, and several special cases are described. Expected observations of AoLP tangential to surface orientation and AoLP perpendicular to the scattering plane are reported. Significant changes in the AoLP are observed from common variations in outdoor illumination conditions. Also, simple variants in material properties change the dominant polarized light scattering process and thus the AoLP. Measurement examples that isolate a 90 deg AoLP flip are shown for a sunny and cloudy day as well as an object of high and low albedo.
AB - Observations from the Ground-based Multiangle SpectroPolarimetric Imager (GroundMSPI) are used to relate angle of linear polarization (AoLP) measurements to material properties and illumination conditions in sunlit outdoor environments. GroundMSPI is a push-broom spectropolarimetric camera with an uncertainty in degree of linear polarization (DoLP) of ±0.005. This polarimetric accuracy yields useful AoLP images even when the DoLP is less than 0.02. AoLP images are reported with respect to dependency on surface texture, surface orientation, albedo, and illumination conditions. Agreement with well-known principles of polarized light scattering is illustrated, and several special cases are described. Expected observations of AoLP tangential to surface orientation and AoLP perpendicular to the scattering plane are reported. Significant changes in the AoLP are observed from common variations in outdoor illumination conditions. Also, simple variants in material properties change the dominant polarized light scattering process and thus the AoLP. Measurement examples that isolate a 90 deg AoLP flip are shown for a sunny and cloudy day as well as an object of high and low albedo.
KW - angle of linear polarization
KW - multiangle spectropolarimetric imager
KW - polarimetric imaging
KW - polarized light scattering
UR - https://www.scopus.com/pages/publications/85069492460
UR - https://www.scopus.com/pages/publications/85069492460#tab=citedBy
U2 - 10.1117/1.OE.58.8.082419
DO - 10.1117/1.OE.58.8.082419
M3 - Article
SN - 0091-3286
VL - 58
JO - Optical Engineering
JF - Optical Engineering
IS - 8
M1 - 082419
ER -