Applications of electron microscopy in collaborative industrial research

F. M. Ross; K. M. Krishnan; N. Thangaraj; R. F.C. Farrow; R. F. Marks; A. Cebollada; S. S.P. Parkin; M. F. Toney; M. Huffman; C. A. Paz De Araujo; L. D. McMillan; J. Cuchiaro; M. C. Scott; C. Echer; F. Ponce; M. A. O'Keefe; E. G. Nelson

doi:10.1557/S0883769400035466

Applications of electron microscopy in collaborative industrial research

F. M. Ross
, K. M. Krishnan
, N. Thangaraj
, R. F.C. Farrow
, R. F. Marks
, A. Cebollada
, S. S.P. Parkin
, M. F. Toney
, M. Huffman
, C. A. Paz De Araujo
, L. D. McMillan
, J. Cuchiaro
, M. C. Scott
, C. Echer
, F. Ponce
, M. A. O'Keefe
, E. G. Nelson

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	17-23
Number of pages	7
Journal	MRS Bulletin
Volume	21
Issue number	5
DOIs	https://doi.org/10.1557/S0883769400035466
State	Published - May 1996
Externally published	Yes

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Physical and Theoretical Chemistry

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10.1557/S0883769400035466

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Ross, F. M., Krishnan, K. M., Thangaraj, N., Farrow, R. F. C., Marks, R. F., Cebollada, A., Parkin, S. S. P., Toney, M. F., Huffman, M., Paz De Araujo, C. A., McMillan, L. D., Cuchiaro, J., Scott, M. C., Echer, C., Ponce, F., O'Keefe, M. A., & Nelson, E. G. (1996). Applications of electron microscopy in collaborative industrial research. MRS Bulletin, 21(5), 17-23. https://doi.org/10.1557/S0883769400035466

Ross, FM, Krishnan, KM, Thangaraj, N, Farrow, RFC, Marks, RF, Cebollada, A, Parkin, SSP, Toney, MF, Huffman, M, Paz De Araujo, CA, McMillan, LD, Cuchiaro, J, Scott, MC, Echer, C, Ponce, F, O'Keefe, MA & Nelson, EG 1996, 'Applications of electron microscopy in collaborative industrial research', MRS Bulletin, vol. 21, no. 5, pp. 17-23. https://doi.org/10.1557/S0883769400035466

@article{97996458bce94688bb97b621d6a6a5fa,

title = "Applications of electron microscopy in collaborative industrial research",

author = "Ross, \{F. M.\} and Krishnan, \{K. M.\} and N. Thangaraj and Farrow, \{R. F.C.\} and Marks, \{R. F.\} and A. Cebollada and Parkin, \{S. S.P.\} and Toney, \{M. F.\} and M. Huffman and \{Paz De Araujo\}, \{C. A.\} and McMillan, \{L. D.\} and J. Cuchiaro and Scott, \{M. C.\} and C. Echer and F. Ponce and O'Keefe, \{M. A.\} and Nelson, \{E. G.\}",

year = "1996",

month = may,

doi = "10.1557/S0883769400035466",

language = "English (US)",

volume = "21",

pages = "17--23",

journal = "MRS Bulletin",

issn = "0883-7694",

publisher = "Materials Research Society",

number = "5",

}

TY - JOUR

T1 - Applications of electron microscopy in collaborative industrial research

AU - Ross, F. M.

AU - Krishnan, K. M.

AU - Thangaraj, N.

AU - Farrow, R. F.C.

AU - Marks, R. F.

AU - Cebollada, A.

AU - Parkin, S. S.P.

AU - Toney, M. F.

AU - Huffman, M.

AU - Paz De Araujo, C. A.

AU - McMillan, L. D.

AU - Cuchiaro, J.

AU - Scott, M. C.

AU - Echer, C.

AU - Ponce, F.

AU - O'Keefe, M. A.

AU - Nelson, E. G.

PY - 1996/5

Y1 - 1996/5

UR - https://www.scopus.com/pages/publications/0030148467

UR - https://www.scopus.com/pages/publications/0030148467#tab=citedBy

U2 - 10.1557/S0883769400035466

DO - 10.1557/S0883769400035466

M3 - Article

SN - 0883-7694

VL - 21

SP - 17

EP - 23

JO - MRS Bulletin

JF - MRS Bulletin

IS - 5

ER -

Applications of electron microscopy in collaborative industrial research

ASJC Scopus subject areas

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