Abstract
With the increase in signal speed and the development of process technology, distributed RC line model is found to be more suitable for on-chip interconnects than lumped RC model, especially for interconnects around and below 0.25 /spl mu/m. In this paper, we first describe a new explicit form for crosstalk approximation for coupled RC lines. Then we introduce a novel passive model order reduction technique for distributed RC lines. These two parts serve as two steps in static noise analysis of full on-chip interconnect networks called pruning process and static analysis process.
Original language | English (US) |
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Article number | 761200 |
Pages (from-to) | 664-668 |
Number of pages | 5 |
Journal | Proceedings -Design, Automation and Test in Europe, DATE |
DOIs | |
State | Published - 1999 |
Event | Design, Automation and Test in Europe Conference and Exhibition 1999, DATE 1999 - Munich, Germany Duration: Mar 9 1999 → Mar 12 1999 |
ASJC Scopus subject areas
- General Engineering