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Delta-Sigma Modulator-Based Compute-in-Memory Neural Network with Analog Feature Extraction and Classification for Edge Sensors

  • Tushar Gupta
  • , Vasundhara Damodaran
  • , Yuan Liao
  • , Jae-sun Seo
  • , Arindam Sanyal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This work presents an on-chip feature extractor and classifier that reduces sensor transmission by >1000× through on-chip data analysis. The classifier includes reservoir computing (RC) layer for unsupervised feature extraction followed by an artificial neural network (ANN) layer for supervised classification. The RC layer is implemented using switched-capacitor circuits, while the ANN uses a delta-sigma modulator-based 9T1C compute-in-memory (CIM) macro that supports variable-resolution precision. A test chip, fabricated in a 28nm process, is demonstrated for stress and seismic event detection. The test-chip achieves mean classification accuracies of 97.0% for stress detection and 95.8% for seismic event detection, with energy consumption of 1.3nJ/classification for stress and 4.25nJ/classification for seismic events.

Original languageEnglish (US)
Title of host publicationISCAS 2026 - 2026 IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3196-3200
Number of pages5
ISBN (Electronic)9798331577698
DOIs
StatePublished - 2026
Externally publishedYes
Event2026 IEEE International Symposium on Circuits and Systems, ISCAS 2026 - Shanghai, China
Duration: May 24 2026 → May 27 2026

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems

Conference

Conference2026 IEEE International Symposium on Circuits and Systems, ISCAS 2026
Country/TerritoryChina
CityShanghai
Period5/24/26 → 5/27/26

Keywords

  • Classifier
  • Compute-in-Memory
  • Reservoir Computing
  • SRAM
  • Switched Capacitor circuits

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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