@article{42d160b34c58428d92d3e8684abcbf9e,
title = "Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography",
abstract = "The detected contrast and dynamic ranges of Cd 1-xZn xTe semiconductor detectors have been measured, within the x-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd 1-xZn xTe detectors have excellent detected contrast response and large dynamic range.",
keywords = "CdZnTe semiconductors, Detected contrast, Digital radiography, Dynamic range, F, Imaging",
author = "Giakos, {George C.} and R. Guntupalli and N. Shah and S. Vedantham and S. Suryanarayanan and S. Chowdhury and R. Nemer and Passerini, {A. G.} and K. Mehta and S. Sumrain and N. Patnekar and K. Nataraj and Evans, {E. A.} and R. Endorf and Fabrizio Russo",
note = "Funding Information: Manuscript received May 4, 2000; revised July 26, 2001. This work was supported by the Institute of Biomedical Engineering Research (IBER), Akron, OH, under a Faculty Enhancement Research grant. G. C. Giakos is with the Department of Electrical Engineering, Imaging Devices, Sensors and Nanoengineering Laboratory, The University of Akron, Akron, OH 44325-3904 (e-mail:
[email protected]). R. Guntupalli, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, R. Nemer, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, and K. Nataraj are with the Olson Research Center, Department of Biomedical Engineering, The University of Akron, Akron, OH 44325-0302 USA. E. A. Evans is with the Department of Chemical Engineering, The University of Akron, Akron, OH 44325 USA. R. Endorf is with the Department of Physics, University of Cincinnati, Cincinnati, OH 45221 USA. F. Russo is with DEEI, University of Trieste, Trieste, Italy. Publisher Item Identifier S 0018-9456(01)10962-9.",
year = "2001",
month = dec,
doi = "10.1109/19.982953",
language = "English (US)",
volume = "50",
pages = "1604--1609",
journal = "IEEE Transactions on Instrumentation and Measurement",
issn = "0018-9456",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",
}