TY - JOUR
T1 - Development of a new methodology to model the synergistic effects between TID and ASETs
AU - Roche, Nicolas J.H.
AU - Dusseau, L.
AU - Boch, J.
AU - Velo, Y. Gonzalez
AU - Vaillé, J. R.
AU - Saigné, F.
AU - Auriel, G.
AU - Azais, B.
AU - Buchner, S. P.
AU - Marec, R.
AU - Calvel, P.
AU - Bezerra, F.
N1 - Funding Information: Manuscript received September 11, 2009; revised January 04, 2010; accepted January 27, 2010. Date of current version August 18, 2010. This work was supported in part by the Délégation Générale pour l’Armement, the Centre National d’Etudes Spatiales and Thalès alenia Space. N. J.-H. Roche, L. Dusseau, J. Boch, Y. Gonzalez Velo, J.-R. Vaillé, and F. Saigné are with the Université Montpellier II, IES—UMR CNRS 5214, F-34095 Montpellier cedex 5, France (e-mail: [email protected]. fr). G. Auriel and B. Azais are with the DGA, Direction de l’Expertise Technique, Centre d’Etudes de Gramat, F-46500 Gramat, France. S. P. Buchner is with the Global Strategies Group, Inc., Crofton, MD 21114 USA. R. Marec and P. Calvel are with the Thales Alenia Space, F-31037 Toulouse cedex 1, France. F. Bezerra is with the CNES, Centre National des Etudes Spatiales, F-31401 Toulouse cedex 9, France. Digital Object Identifier 10.1109/TNS.2010.2042616
PY - 2010/8
Y1 - 2010/8
N2 - A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the analog single event transients propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.
AB - A high level model is developed using circuit analysis to predict the synergy effect observed on a three stages operational amplifier. This model makes possible to explain and to predict the analog single event transients propagation in circuitry. The effect of total ionizing dose is taken into account by varying the model parameters using the monitoring of the usual supply current induced degradation of the operational amplifier.
KW - Bipolar analog integrated circuits
KW - integrated circuit modeling
KW - ionizing dose
KW - single event transient
KW - transient propagation
KW - transient response
UR - https://www.scopus.com/pages/publications/77955822779
UR - https://www.scopus.com/pages/publications/77955822779#tab=citedBy
U2 - 10.1109/TNS.2010.2042616
DO - 10.1109/TNS.2010.2042616
M3 - Article
SN - 0018-9499
VL - 57
SP - 1861
EP - 1868
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
IS - 4 PART 1
M1 - 5550420
ER -