TY - GEN
T1 - Diagnosis of the failing component in RF receivers through adaptive full-path measurements
AU - Acar, Erkan
AU - Ozev, Sule
PY - 2005
Y1 - 2005
N2 - Decreasing profit margins and time-to-market windows for radiofrequency transceivers, rule out the traditional component-based testing and diagnosis methods. Over the past few years, there has been a significant shift in the transceiver test methods towards full-path and loop-back testing. However, the benefits of path-based testing cannot be fully attained unless complimentary diagnosis methods can be developed. In this paper, we present an adaptive diagnosis methodology to identify the failing component in RF receivers. Once the fault type (hard fault or soft fault) is identified using eigensignature correlations, input signals are selected and ambiguity groups determined. A new input signal is applied based on the ambiguity groups until full diagnostic resolution is reached or test inputs are exhausted. While it is typically believed that partitioned parameters, such as the gain of an individual component, cannot be fully diagnosed, the inherently non-linear behavior of analog blocks results in distinguishable response patterns even for scalar parameters. Experimental results confirm that diagnosis using only path-based measurements is viable.
AB - Decreasing profit margins and time-to-market windows for radiofrequency transceivers, rule out the traditional component-based testing and diagnosis methods. Over the past few years, there has been a significant shift in the transceiver test methods towards full-path and loop-back testing. However, the benefits of path-based testing cannot be fully attained unless complimentary diagnosis methods can be developed. In this paper, we present an adaptive diagnosis methodology to identify the failing component in RF receivers. Once the fault type (hard fault or soft fault) is identified using eigensignature correlations, input signals are selected and ambiguity groups determined. A new input signal is applied based on the ambiguity groups until full diagnostic resolution is reached or test inputs are exhausted. While it is typically believed that partitioned parameters, such as the gain of an individual component, cannot be fully diagnosed, the inherently non-linear behavior of analog blocks results in distinguishable response patterns even for scalar parameters. Experimental results confirm that diagnosis using only path-based measurements is viable.
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U2 - 10.1109/VTS.2005.42
DO - 10.1109/VTS.2005.42
M3 - Conference contribution
SN - 0769523145
SN - 9780769523149
T3 - Proceedings of the IEEE VLSI Test Symposium
SP - 374
EP - 379
BT - Proceedings - 23rd IEEE VLSI Test Symposium, VTS 2005
T2 - 23rd IEEE VLSI Test Symposium, VTS 2005
Y2 - 1 May 2005 through 5 May 2005
ER -