Diffraction effects in interferometry

Ping Zhou; James H. Burge

doi:10.1364/oft.2010.oma3

Diffraction effects in interferometry

Ping Zhou
, James H. Burge

James C Wyant Coll Optical Sci

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

Original language	English (US)
Title of host publication	Optical Fabrication and Testing, OFT 2010
Publisher	Optical Society of America (OSA)
ISBN (Print)	9781557528933
DOIs	https://doi.org/10.1364/oft.2010.oma3
State	Published - Dec 1 2010
Event	Optical Fabrication and Testing, OFT 2010 - Jackson Hole, WY, United States Duration: Jun 13 2010 → Jun 17 2010

Publication series

Name	Optics InfoBase Conference Papers

Other

Other	Optical Fabrication and Testing, OFT 2010
Country/Territory	United States
City	Jackson Hole, WY
Period	6/13/10 → 6/17/10

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

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10.1364/oft.2010.oma3

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@inproceedings{e1b786c104554a0d83d96de242f585c9,

title = "Diffraction effects in interferometry",

abstract = "Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.",

author = "Ping Zhou and Burge, \{James H.\}",

year = "2010",

month = dec,

day = "1",

doi = "10.1364/oft.2010.oma3",

language = "English (US)",

isbn = "9781557528933",

series = "Optics InfoBase Conference Papers",

publisher = "Optical Society of America (OSA)",

booktitle = "Optical Fabrication and Testing, OFT 2010",

note = "Optical Fabrication and Testing, OFT 2010 ; Conference date: 13-06-2010 Through 17-06-2010",

}

TY - GEN

T1 - Diffraction effects in interferometry

AU - Zhou, Ping

AU - Burge, James H.

PY - 2010/12/1

Y1 - 2010/12/1

N2 - Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

AB - Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.

UR - https://www.scopus.com/pages/publications/85087601088

UR - https://www.scopus.com/pages/publications/85087601088#tab=citedBy

UR - https://www.scopus.com/pages/publications/84896787115

UR - https://www.scopus.com/pages/publications/84896787115#tab=citedBy

U2 - 10.1364/oft.2010.oma3

DO - 10.1364/oft.2010.oma3

M3 - Conference contribution

SN - 9781557528933

T3 - Optics InfoBase Conference Papers

BT - Optical Fabrication and Testing, OFT 2010

PB - Optical Society of America (OSA)

T2 - Optical Fabrication and Testing, OFT 2010

Y2 - 13 June 2010 through 17 June 2010

ER -

Diffraction effects in interferometry

Abstract

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ASJC Scopus subject areas

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