Electric field driven degradation of AlGaN/GaN high electron mobility transistors during off-state stress
- C. Y. Chang
- , E. A. Douglas
- , J. Kim
- , L. Liu
- , C. F. Lo
- , B. H. Chu
- , D. J. Cheney
- , B. P. Gila
- , F. Ren
- , G. D. Via
- , D. A. Cullen
- , L. Zhou
- , David Smith
- , S. Jang
- , S. J. Pearton
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution