ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.

N. J. Shah, H. Ahmed, L. A. Freeman, David J. Smith

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Institute of Physics Conference Series
Publisher	Inst of Physics
Pages	125-130
Number of pages	6
Edition	67
ISBN (Print)	0854981586
State	Published - 1983
Externally published	Yes

Name	Institute of Physics Conference Series
Number	67

ASJC Scopus subject areas

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title = "ELECTRON MICROSCOPY OF Se-IMPLANTED AND ELECTRON-BEAM ANNEALED GaAs.",

author = "Shah, {N. J.} and H. Ahmed and Freeman, {L. A.} and Smith, {David J.}",

year = "1983",

language = "English (US)",

isbn = "0854981586",

series = "Institute of Physics Conference Series",

publisher = "Inst of Physics",

number = "67",

pages = "125--130",

booktitle = "Institute of Physics Conference Series",

edition = "67",

}

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AU - Ahmed, H.

AU - Freeman, L. A.

AU - Smith, David J.

PY - 1983

Y1 - 1983

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M3 - Conference contribution

SN - 0854981586

T3 - Institute of Physics Conference Series

SP - 125

EP - 130

BT - Institute of Physics Conference Series

PB - Inst of Physics

ER -