TY - JOUR
T1 - Error analysis and correction in a beam profile monitor
AU - Graves, William S.
N1 - Funding Information: The ion profile monitor (IPM) \[1\]m easures transverse beam profiles in the Fermilab booster synchrotron. This This work was supported by the U.S. Dept. of Energy. 1 Present address: Brookhaven National Lab, Upton, NY, USA.
PY - 1995/9/21
Y1 - 1995/9/21
N2 - An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.
AB - An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.
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U2 - 10.1016/0168-9002(95)00219-7
DO - 10.1016/0168-9002(95)00219-7
M3 - Article
SN - 0168-9002
VL - 364
SP - 19
EP - 26
JO - Nuclear Inst. and Methods in Physics Research, A
JF - Nuclear Inst. and Methods in Physics Research, A
IS - 1
ER -