Error analysis and correction in a beam profile monitor

William S. Graves

doi:10.1016/0168-9002(95)00219-7

Error analysis and correction in a beam profile monitor

William S. Graves

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.

Original language	English (US)
Pages (from-to)	19-26
Number of pages	8
Journal	Nuclear Inst. and Methods in Physics Research, A
Volume	364
Issue number	1
DOIs	https://doi.org/10.1016/0168-9002(95)00219-7
State	Published - Sep 21 1995
Externally published	Yes

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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10.1016/0168-9002(95)00219-7

Cite this

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title = "Error analysis and correction in a beam profile monitor",

abstract = "An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.",

author = "Graves, \{William S.\}",

note = "Funding Information: The ion profile monitor (IPM) \textbackslash{}[1\textbackslash{}]m easures transverse beam profiles in the Fermilab booster synchrotron. This This work was supported by the U.S. Dept. of Energy. 1 Present address: Brookhaven National Lab, Upton, NY, USA.",

year = "1995",

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doi = "10.1016/0168-9002(95)00219-7",

language = "English (US)",

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T1 - Error analysis and correction in a beam profile monitor

AU - Graves, William S.

N1 - Funding Information: The ion profile monitor (IPM) \[1\]m easures transverse beam profiles in the Fermilab booster synchrotron. This This work was supported by the U.S. Dept. of Energy. 1 Present address: Brookhaven National Lab, Upton, NY, USA.

PY - 1995/9/21

Y1 - 1995/9/21

N2 - An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.

AB - An analysis of the accuracy and sources of error of transverse beam profile measurements made with an ion profile monitor in the Fermilab booster is presented. Two dimensional computer simulations are compared with experiment to determine the magnitude of the errors and a correction algorithm that uses beam size and charge as parameters is developed.

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U2 - 10.1016/0168-9002(95)00219-7

DO - 10.1016/0168-9002(95)00219-7

M3 - Article

SN - 0168-9002

VL - 364

SP - 19

EP - 26

JO - Nuclear Inst. and Methods in Physics Research, A

JF - Nuclear Inst. and Methods in Physics Research, A

IS - 1

ER -

Error analysis and correction in a beam profile monitor

Abstract

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