Evaluating SMR Positioning with an Autostigmatic Microscope

Karlene Karrfalt, Robert E. Parks, Daewook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An optical method of determining the location of the apex of a corner reflector mounted in a steel ball, commonly referred to as a Spherically Mounted Retroreflector (SMR), relative to the center of the ball to the 1-2 µm level was previously described by us. The method used an autostigmatic microscope focused on the apex and viewed the reflected spot image as the SMR was rotated about a normal to its entrance aperture. This measurement determined the lateral offset of the apex and tipping the SMR while viewing the spot gave an indication of the axial displacement. A related questions arose recently, could the distance between two SMRs be determined to the same level of precision if the SMRs were rigidly mounted in a fixture so they could not be moved. We show the answer is yes assuming the stage moving the pair of SMRs has the required precision. As a SMR is scanned under the autostigmatic microscope the spot motion seen by the microscope is identical to that seen when scanning a spherical ball under the microscope and we have already shown that balls centers can be found to 1 µm precision using a 10x objective. We show experimentally that we can determine the distance between 2 SMRs by repeated measurements with the balls in different azimuthal orientations, and show that by taking into account the orientation, the distance between SMRs remains the same within experimental errors.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing XIV
EditorsDaewook Kim, Heejoo Choi, Heidi Ottevaere, Rolf Rascher
PublisherSPIE
ISBN (Electronic)9781510654266
DOIs
StatePublished - 2022
EventOptical Manufacturing and Testing XIV 2022 - San Diego, United States
Duration: Aug 22 2022Aug 24 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12221

Conference

ConferenceOptical Manufacturing and Testing XIV 2022
Country/TerritoryUnited States
CitySan Diego
Period8/22/228/24/22

Keywords

  • Autostigmatic Microscope
  • PSM
  • Point Source Microscope
  • SMR
  • Spherically mounted retroreflector

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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