Germanium loaded zeolite Y: Preparation and characterization

S. Tomiya; P. M. Petroff; D. Margolese; V. I. Srdanov; G. D. Stucky; Y. H. Zhang

Germanium loaded zeolite Y: Preparation and characterization

S. Tomiya, P. M. Petroff, D. Margolese, V. I. Srdanov, G. D. Stucky, Y. H. Zhang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The cavities of molecular sieves offer an opportunity for synthesis of periodically ordered semiconductor nanoclusters. Ge clusters were synthesized in zeolite Y by thermal decomposition of GeH₄ absorbed in the zeolite cages. Upon inclusion of germanium in proton exchanged zeolite Y (HY), the X-ray diffraction (XRD) pattern shows a small change in line positions and considerable change in intensities. No extra reflections were detected in either XRD or transmission electron diffraction (TED) for the samples synthesized at 300 °C. These observations are in accordance with the energy dispersive X-ray (EDX) spectroscopy data which reveal the presence of germanium within the HY in concentrations higher than 5×10¹⁹ cm^-3. At annealing temperatures higher than 500 °C, small Ge crystallites (approximately 0.2 μm) form on the exterior surface of the HY, as documented by TED, TEM and absorption spectroscopy. The results from the absorption and photoluminescence spectroscopy of the Ge loaded HY will be discussed.

Original language	English (US)
Title of host publication	Materials Research Society Symposium Proceedings
Publisher	Publ by Materials Research Society
Pages	353-358
Number of pages	6
ISBN (Print)	1558991816
State	Published - Jan 1 1993
Externally published	Yes
Event	Proceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials - Boston, MA, USA Duration: Nov 30 1992 → Dec 3 1992

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	286

Other

Other	Proceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials
City	Boston, MA, USA
Period	11/30/92 → 12/3/92

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Cite this

Tomiya, S, Petroff, PM, Margolese, D, Srdanov, VI, Stucky, GD & Zhang, YH 1993, Germanium loaded zeolite Y: Preparation and characterization. in Materials Research Society Symposium Proceedings. Materials Research Society Symposium Proceedings, vol. 286, Publ by Materials Research Society, pp. 353-358, Proceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials, Boston, MA, USA, 11/30/92.

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title = "Germanium loaded zeolite Y: Preparation and characterization",

abstract = "The cavities of molecular sieves offer an opportunity for synthesis of periodically ordered semiconductor nanoclusters. Ge clusters were synthesized in zeolite Y by thermal decomposition of GeH4 absorbed in the zeolite cages. Upon inclusion of germanium in proton exchanged zeolite Y (HY), the X-ray diffraction (XRD) pattern shows a small change in line positions and considerable change in intensities. No extra reflections were detected in either XRD or transmission electron diffraction (TED) for the samples synthesized at 300 °C. These observations are in accordance with the energy dispersive X-ray (EDX) spectroscopy data which reveal the presence of germanium within the HY in concentrations higher than 5×1019 cm-3. At annealing temperatures higher than 500 °C, small Ge crystallites (approximately 0.2 μm) form on the exterior surface of the HY, as documented by TED, TEM and absorption spectroscopy. The results from the absorption and photoluminescence spectroscopy of the Ge loaded HY will be discussed.",

author = "S. Tomiya and Petroff, {P. M.} and D. Margolese and Srdanov, {V. I.} and Stucky, {G. D.} and Zhang, {Y. H.}",

year = "1993",

month = jan,

day = "1",

language = "English (US)",

isbn = "1558991816",

series = "Materials Research Society Symposium Proceedings",

publisher = "Publ by Materials Research Society",

pages = "353--358",

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TY - GEN

T1 - Germanium loaded zeolite Y

T2 - Proceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials

AU - Tomiya, S.

AU - Petroff, P. M.

AU - Margolese, D.

AU - Srdanov, V. I.

AU - Stucky, G. D.

AU - Zhang, Y. H.

PY - 1993/1/1

Y1 - 1993/1/1

N2 - The cavities of molecular sieves offer an opportunity for synthesis of periodically ordered semiconductor nanoclusters. Ge clusters were synthesized in zeolite Y by thermal decomposition of GeH4 absorbed in the zeolite cages. Upon inclusion of germanium in proton exchanged zeolite Y (HY), the X-ray diffraction (XRD) pattern shows a small change in line positions and considerable change in intensities. No extra reflections were detected in either XRD or transmission electron diffraction (TED) for the samples synthesized at 300 °C. These observations are in accordance with the energy dispersive X-ray (EDX) spectroscopy data which reveal the presence of germanium within the HY in concentrations higher than 5×1019 cm-3. At annealing temperatures higher than 500 °C, small Ge crystallites (approximately 0.2 μm) form on the exterior surface of the HY, as documented by TED, TEM and absorption spectroscopy. The results from the absorption and photoluminescence spectroscopy of the Ge loaded HY will be discussed.

AB - The cavities of molecular sieves offer an opportunity for synthesis of periodically ordered semiconductor nanoclusters. Ge clusters were synthesized in zeolite Y by thermal decomposition of GeH4 absorbed in the zeolite cages. Upon inclusion of germanium in proton exchanged zeolite Y (HY), the X-ray diffraction (XRD) pattern shows a small change in line positions and considerable change in intensities. No extra reflections were detected in either XRD or transmission electron diffraction (TED) for the samples synthesized at 300 °C. These observations are in accordance with the energy dispersive X-ray (EDX) spectroscopy data which reveal the presence of germanium within the HY in concentrations higher than 5×1019 cm-3. At annealing temperatures higher than 500 °C, small Ge crystallites (approximately 0.2 μm) form on the exterior surface of the HY, as documented by TED, TEM and absorption spectroscopy. The results from the absorption and photoluminescence spectroscopy of the Ge loaded HY will be discussed.

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M3 - Conference contribution

SN - 1558991816

T3 - Materials Research Society Symposium Proceedings

SP - 353

EP - 358

BT - Materials Research Society Symposium Proceedings

PB - Publ by Materials Research Society

Y2 - 30 November 1992 through 3 December 1992

ER -

Germanium loaded zeolite Y: Preparation and characterization

Abstract

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