Guest editors' introduction: Compact variability modeling in scaled CMOS design

Yu Cao, Frank Liu

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish (US)
Article number5432317
Pages (from-to)6-7
Number of pages2
JournalIEEE Design and Test of Computers
Volume27
Issue number2
DOIs
StatePublished - Mar 2010

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this