TY - GEN
T1 - Hierarchical analysis of process variation for mixed-signal systems
AU - Liu, Fang
AU - Ozev, Sule
PY - 2005
Y1 - 2005
N2 - Increasing process variability necessitates reliable analysis of its effects on circuit performance not only at the top level but also at intermediate levels. Mixed-signal circuits with multiple hierarchical layers, multiple parameters, and complex functional relations are especially susceptible to such variations. In this paper, we present a hierarchical method for process variation analysis. The ability to compute the variance of parameters at each hierarchical layer makes the method particularly suited for helping designers through design iterations. Experimental results indicate that the proposed method achieves high computational efficiency with up to 2% compromise in accuracy even for highly non-linear functional relations.
AB - Increasing process variability necessitates reliable analysis of its effects on circuit performance not only at the top level but also at intermediate levels. Mixed-signal circuits with multiple hierarchical layers, multiple parameters, and complex functional relations are especially susceptible to such variations. In this paper, we present a hierarchical method for process variation analysis. The ability to compute the variance of parameters at each hierarchical layer makes the method particularly suited for helping designers through design iterations. Experimental results indicate that the proposed method achieves high computational efficiency with up to 2% compromise in accuracy even for highly non-linear functional relations.
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U2 - 10.1145/1120725.1120914
DO - 10.1145/1120725.1120914
M3 - Conference contribution
SN - 0780387368
SN - 9780780387362
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 465
EP - 470
BT - Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Y2 - 18 January 2005 through 21 January 2005
ER -