Abstract
In this study, the temporal response of a planar Cd1-xZnxTe sample at each frequency of a scanning square-wave test pattern, have been measured. The experimental arrangement, although is not offered for large field-of-view imaging applications, offers potential capabilities for feasibility studies, research and evaluation of the temporal response and noise characteristics of a Cd1-xZnxTe detector, for fast digital radiographic and CT applications. The dependence of the modulation transfer function (MTF(f)) of the experimental x-ray detector system of both the applied electric field and thickness has been determined experimentally. The results of this study indicate that the overall MTF(f) of the CdZnTe detector system improves both with increasing applied bias voltage and decreasing the detector thickness. Further improvement of the geometrical and signal collection parameters will improve the spatial resolution of the x-ray system significantly.
Original language | English (US) |
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Pages | 358-363 |
Number of pages | 6 |
State | Published - 1998 |
Externally published | Yes |
Event | Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) - St.Paul, MN, USA Duration: May 18 1998 → May 21 1998 |
Other
Other | Proceedings of the 1998 IEEE Instrumentation and Measurement Technology Conference, IMTC. Part 1 (of 2) |
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City | St.Paul, MN, USA |
Period | 5/18/98 → 5/21/98 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering