Impact of the LCD monitor locations on a novel alignment method: the combination of deflectometry and the sine condition test

Hyemin Yoo, Matthew Dubin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

We have proposed a new alignment method which is the combination of deflectometry and the sine condition test. One of the great advantages of the new approach is that we need a camera and an LCD monitor larger than the clear aperture of the telescope instead of an interferometer and a return flat. To determine the state of the alignment, we have to place the monitor at two different locations: ideally at the rear principal plane of the telescope and a few meters displaced from the rear principal plane. However, for practical reasons, we may have to place the monitor closer to the telescope. We have simulated how changing the monitor location impacts the alignment, and we show the consequences of variations in the LCD locations on the alignment of a telescope using the new method.

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification XIV
EditorsJose Sasian, Richard N. Youngworth
PublisherSPIE
ISBN (Electronic)9781510654280
DOIs
StatePublished - 2022
EventOptical System Alignment, Tolerancing, and Verification XIV 2022 - San Diego, United States
Duration: Aug 21 2022 → …

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12222

Conference

ConferenceOptical System Alignment, Tolerancing, and Verification XIV 2022
Country/TerritoryUnited States
CitySan Diego
Period8/21/22 → …

Keywords

  • Alignment
  • deflectometry
  • sine condition test

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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