Abstract
We propose a synchronized calibration method for deflectometry that effectively addresses systematic errors caused by instability. This method enables nanometric-level, in-situ online measurement of optical surfaces.
| Original language | English (US) |
|---|---|
| DOIs | |
| State | Published - 2025 |
| Event | 2025 Optical Fabrication and Testing, OFT 2025 - Denver, United States Duration: Jun 16 2025 → Jun 19 2025 |
Conference
| Conference | 2025 Optical Fabrication and Testing, OFT 2025 |
|---|---|
| Country/Territory | United States |
| City | Denver |
| Period | 6/16/25 → 6/19/25 |
ASJC Scopus subject areas
- General Computer Science
- Space and Planetary Science
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Instrumentation
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