Abstract
A novel method for the in situ thermomechanical test of micro/nanoscale samples at high temperature is presented. During the in situ test, the stage is resistively heated while the temperature is measured by a cofabricated temperature sensor. For experimental demonstration of the thermomechanical testing method, we fabricate the Micro-Electro-Mechanical Systems (MEMS) stage using silicon carbide (SiC) and carry out in situ uniaxial tests for single-crystal silicon (SCS) microsamples at temperatures from room temperature to 400 °C. We recover the known elastic modulus of SCS within 1% error in this temperature range.
Original language | English (US) |
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Pages (from-to) | 13-16 |
Number of pages | 4 |
Journal | MRS Communications |
Volume | 1 |
Issue number | 1 |
DOIs | |
State | Published - Nov 2011 |
Externally published | Yes |
ASJC Scopus subject areas
- General Materials Science