Innovative Design for Test in State-of-the-Art Analog Systems

Hans Martin Von Staudt; Amit Majumdar; Bill Taylor; Jennifer Kitchen

doi:10.1109/VTS.2019.8758607

Innovative Design for Test in State-of-the-Art Analog Systems

Hans Martin Von Staudt, Amit Majumdar, Bill Taylor, Jennifer Kitchen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practice session highlights various aspects of design for test (DfT) in high-complexity, analog-dominated systems with three talks that focus on: DfT in power management integrated circuits (ICs), an alternative testing method to analog test bus, and pre-silicon built-in self-test (BIST) verification, where BIST is used to monitor complex mixed-signal systems. These talks will be given by industry experts from Dialog Semiconductor, Xilinx, and Texas Instruments.

Original language	English (US)
Title of host publication	2019 IEEE 37th VLSI Test Symposium, VTS 2019
Publisher	IEEE Computer Society
ISBN (Electronic)	9781728111704
DOIs	https://doi.org/10.1109/VTS.2019.8758607
State	Published - Apr 2019
Event	37th IEEE VLSI Test Symposium, VTS 2019 - Monterey, United States Duration: Apr 23 2019 → Apr 25 2019

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	2019-April

Conference

Conference	37th IEEE VLSI Test Symposium, VTS 2019
Country/Territory	United States
City	Monterey
Period	4/23/19 → 4/25/19

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2019.8758607

Cite this

Von Staudt, HM, Majumdar, A, Taylor, B & Kitchen, J 2019, Innovative Design for Test in State-of-the-Art Analog Systems. in 2019 IEEE 37th VLSI Test Symposium, VTS 2019., 8758607, Proceedings of the IEEE VLSI Test Symposium, vol. 2019-April, IEEE Computer Society, 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, United States, 4/23/19. https://doi.org/10.1109/VTS.2019.8758607

@inproceedings{3aa7bad9138a47088215d2e4d6541155,

title = "Innovative Design for Test in State-of-the-Art Analog Systems",

abstract = "There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practice session highlights various aspects of design for test (DfT) in high-complexity, analog-dominated systems with three talks that focus on: DfT in power management integrated circuits (ICs), an alternative testing method to analog test bus, and pre-silicon built-in self-test (BIST) verification, where BIST is used to monitor complex mixed-signal systems. These talks will be given by industry experts from Dialog Semiconductor, Xilinx, and Texas Instruments.",

author = "{Von Staudt}, {Hans Martin} and Amit Majumdar and Bill Taylor and Jennifer Kitchen",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 37th IEEE VLSI Test Symposium, VTS 2019 ; Conference date: 23-04-2019 Through 25-04-2019",

year = "2019",

month = apr,

doi = "10.1109/VTS.2019.8758607",

language = "English (US)",

series = "Proceedings of the IEEE VLSI Test Symposium",

publisher = "IEEE Computer Society",

booktitle = "2019 IEEE 37th VLSI Test Symposium, VTS 2019",

}

TY - GEN

T1 - Innovative Design for Test in State-of-the-Art Analog Systems

AU - Von Staudt, Hans Martin

AU - Majumdar, Amit

AU - Taylor, Bill

AU - Kitchen, Jennifer

PY - 2019/4

Y1 - 2019/4

N2 - There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practice session highlights various aspects of design for test (DfT) in high-complexity, analog-dominated systems with three talks that focus on: DfT in power management integrated circuits (ICs), an alternative testing method to analog test bus, and pre-silicon built-in self-test (BIST) verification, where BIST is used to monitor complex mixed-signal systems. These talks will be given by industry experts from Dialog Semiconductor, Xilinx, and Texas Instruments.

AB - There is a growing demand for low-cost and effective test solutions to support state-of-the-art analog and mixed-signal systems that are continuously increasing in complexity and functionality, while decreasing in product cost. This innovative practice session highlights various aspects of design for test (DfT) in high-complexity, analog-dominated systems with three talks that focus on: DfT in power management integrated circuits (ICs), an alternative testing method to analog test bus, and pre-silicon built-in self-test (BIST) verification, where BIST is used to monitor complex mixed-signal systems. These talks will be given by industry experts from Dialog Semiconductor, Xilinx, and Texas Instruments.

UR - http://www.scopus.com/inward/record.url?scp=85069214341&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85069214341&partnerID=8YFLogxK

U2 - 10.1109/VTS.2019.8758607

DO - 10.1109/VTS.2019.8758607

M3 - Conference contribution

T3 - Proceedings of the IEEE VLSI Test Symposium

BT - 2019 IEEE 37th VLSI Test Symposium, VTS 2019

PB - IEEE Computer Society

T2 - 37th IEEE VLSI Test Symposium, VTS 2019

Y2 - 23 April 2019 through 25 April 2019

ER -

Innovative Design for Test in State-of-the-Art Analog Systems

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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