Investigation of Tibetian Plateau varnish: New findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Kurt A. Langworthy; David H. Krinsley; Ronald Dorn

doi:10.1002/sca.20226

Investigation of Tibetian Plateau varnish: New findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Kurt A. Langworthy, David H. Krinsley, Ronald Dorn

Research output: Contribution to journal › Review article › peer-review

5 Scopus citations

Abstract

Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.

Original language	English (US)
Pages (from-to)	78-81
Number of pages	4
Journal	Scanning
Volume	33
Issue number	2
DOIs	https://doi.org/10.1002/sca.20226
State	Published - Mar 2011

Keywords

EDS
FIB
STEM
Tibet
geology
nanoscale

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Instrumentation

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10.1002/sca.20226

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title = "Investigation of Tibetian Plateau varnish: New findings at the nanoscale using focused ion beam and transmission electron microscopy techniques",

abstract = "Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.",

keywords = "EDS, FIB, STEM, Tibet, geology, nanoscale",

author = "Langworthy, {Kurt A.} and Krinsley, {David H.} and Ronald Dorn",

year = "2011",

month = mar,

doi = "10.1002/sca.20226",

language = "English (US)",

volume = "33",

pages = "78--81",

journal = "Scanning",

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publisher = "John Wiley and Sons Inc.",

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T2 - New findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

AU - Langworthy, Kurt A.

AU - Krinsley, David H.

AU - Dorn, Ronald

PY - 2011/3

Y1 - 2011/3

N2 - Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.

AB - Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.

KW - EDS

KW - FIB

KW - STEM

KW - Tibet

KW - geology

KW - nanoscale

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U2 - 10.1002/sca.20226

DO - 10.1002/sca.20226

M3 - Review article

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VL - 33

SP - 78

EP - 81

JO - Scanning

JF - Scanning

IS - 2

ER -

Investigation of Tibetian Plateau varnish: New findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Abstract

Keywords

ASJC Scopus subject areas

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