Abstract
Lateral resolution enhancement in confocal self-interference microscopy (CSIM) is evaluated. CSIM, which uses the birefringence of the calcite plate to generate self-interference pattern, sharpens the central lobe of the effective spot. Numerical simulation results of two-dimensional imaging performances are presented. Two-point resolution of 149nm is achieved, which is enhanced by nearly 100% compared to that of confocal microscopy.
| Original language | English (US) |
|---|---|
| Article number | 32 |
| Pages (from-to) | 152-163 |
| Number of pages | 12 |
| Journal | Progress in Biomedical Optics and Imaging - Proceedings of SPIE |
| Volume | 5701 |
| DOIs | |
| State | Published - 2005 |
| Event | Three- Dimensional and Multidomensional Microscopy: Image Acquisition and Processing XII - San Jose, CA, United States Duration: Jan 25 2005 → Jan 27 2005 |
Keywords
- Birefringence
- Confocal microscopy
- Self-interference
- Superresolution
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Biomaterials
- Atomic and Molecular Physics, and Optics
- Radiology Nuclear Medicine and imaging