Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

Emrah Celik; Erkan Oterkus; Ibrahim Guven; Erdogan Madenci

doi:10.1109/ECTC.2009.5074026

Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

Emrah Celik, Erkan Oterkus, Ibrahim Guven, Erdogan Madenci

Aerospace and Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Scopus citations

Abstract

In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.

Original language	English (US)
Title of host publication	2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009
Pages	262-268
Number of pages	7
DOIs	https://doi.org/10.1109/ECTC.2009.5074026
State	Published - 2009
Event	2009 59th Electronic Components and Technology Conference, ECTC 2009 - San Diego, CA, United States Duration: May 26 2009 → May 29 2009

Publication series

Name	Proceedings - Electronic Components and Technology Conference

Other

Other	2009 59th Electronic Components and Technology Conference, ECTC 2009
Country/Territory	United States
City	San Diego, CA
Period	5/26/09 → 5/29/09

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/ECTC.2009.5074026

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Celik, E., Oterkus, E., Guven, I., & Madenci, E. (2009). Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations. In 2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009 (pp. 262-268). Article 5074026 (Proceedings - Electronic Components and Technology Conference). https://doi.org/10.1109/ECTC.2009.5074026

Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations. / Celik, Emrah; Oterkus, Erkan; Guven, Ibrahim et al.
2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009. 2009. p. 262-268 5074026 (Proceedings - Electronic Components and Technology Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Celik, E, Oterkus, E, Guven, I & Madenci, E 2009, Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations. in 2009 Proceedings 59th Electronic Components and Technology Conference, ECTC 2009., 5074026, Proceedings - Electronic Components and Technology Conference, pp. 262-268, 2009 59th Electronic Components and Technology Conference, ECTC 2009, San Diego, CA, United States, 5/26/09. https://doi.org/10.1109/ECTC.2009.5074026

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abstract = "In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.",

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doi = "10.1109/ECTC.2009.5074026",

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AB - In this study, the loading-unloading data obtained from the nono-indentation tests in combination with the peridynamic simulations are used to determine the elastic modulus and yield stress of the material. A simple search algorithm minimizing the difference between the predicted force- indentation depth and experiments leads to the determination of the material properties. Nano-indentation experiments are performed on both a soft polymer (polymethyldisiloxane (PDMS)) representative of the bulk dimensions, and a hard thin-film polymer (polystyrene (PS)) deposited on the bulk PDMS. Both the simulation and experimental results are validated by comparison against those previously published in the literature.

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Mechanical characterization of ultra-thin films by combining AFM nanoindentation tests and peridynamic simulations

Abstract

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