Meter-class infrared deflectometry for visibly non-specular surface metrology

Joel Berkson; Zack Hatfield; Alex St Peter; Henry Quach; Emily Rodriguez; Naomi Nguyen; Wyatt Ellis; Kevin Derby; Christian Davila-Peralta; Justin Hyatt; Dae Wook Kim

Meter-class infrared deflectometry for visibly non-specular surface metrology

Joel Berkson, Zack Hatfield, Alex St Peter, Henry Quach, Emily Rodriguez, Naomi Nguyen, Wyatt Ellis, Kevin Derby, Christian Davila-Peralta, Justin Hyatt, Dae Wook Kim

Optical Sciences

Research output: Contribution to journal › Conference article › peer-review

Abstract

Large, slow freeform optics are challenging to measure, especially if their surfaces are non-specular in the visible; however, using deflectometry with a thermal source allows measurement of both rough and freeform surfaces to high precision.

Original language	English (US)
Article number	JTu2B.3
Journal	Optics InfoBase Conference Papers
State	Published - 2021
Event	Freeform Optics, Freeform 2021 - Part of OSA Optical Design and Fabrication 2021 - Virtual, Online, United States Duration: Jun 27 2021 → Jul 1 2021

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Cite this

@article{3db534132c534caabb47f4421056b9aa,

title = "Meter-class infrared deflectometry for visibly non-specular surface metrology",

abstract = "Large, slow freeform optics are challenging to measure, especially if their surfaces are non-specular in the visible; however, using deflectometry with a thermal source allows measurement of both rough and freeform surfaces to high precision.",

author = "Joel Berkson and Zack Hatfield and Peter, {Alex St} and Henry Quach and Emily Rodriguez and Naomi Nguyen and Wyatt Ellis and Kevin Derby and Christian Davila-Peralta and Justin Hyatt and Kim, {Dae Wook}",

note = "Publisher Copyright: {\textcopyright} 2021 J. Berkson et al.; Freeform Optics, Freeform 2021 - Part of OSA Optical Design and Fabrication 2021 ; Conference date: 27-06-2021 Through 01-07-2021",

year = "2021",

language = "English (US)",

journal = "Optics InfoBase Conference Papers",

issn = "2162-2701",

}

TY - JOUR

T1 - Meter-class infrared deflectometry for visibly non-specular surface metrology

AU - Berkson, Joel

AU - Hatfield, Zack

AU - Peter, Alex St

AU - Quach, Henry

AU - Rodriguez, Emily

AU - Nguyen, Naomi

AU - Ellis, Wyatt

AU - Derby, Kevin

AU - Davila-Peralta, Christian

AU - Hyatt, Justin

AU - Kim, Dae Wook

PY - 2021

Y1 - 2021

N2 - Large, slow freeform optics are challenging to measure, especially if their surfaces are non-specular in the visible; however, using deflectometry with a thermal source allows measurement of both rough and freeform surfaces to high precision.

AB - Large, slow freeform optics are challenging to measure, especially if their surfaces are non-specular in the visible; however, using deflectometry with a thermal source allows measurement of both rough and freeform surfaces to high precision.

UR - http://www.scopus.com/inward/record.url?scp=85119516871&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85119516871&partnerID=8YFLogxK

M3 - Conference article

SN - 2162-2701

JO - Optics InfoBase Conference Papers

JF - Optics InfoBase Conference Papers

M1 - JTu2B.3

T2 - Freeform Optics, Freeform 2021 - Part of OSA Optical Design and Fabrication 2021

Y2 - 27 June 2021 through 1 July 2021

ER -

Meter-class infrared deflectometry for visibly non-specular surface metrology

Abstract

ASJC Scopus subject areas

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