Methods for designing low-leakage power supply clamps

Timothy J. Maloney; Steven S. Poon

Methods for designing low-leakage power supply clamps

Timothy J. Maloney, Steven S. Poon

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Low power semiconductor components require minimizing leakage currents including those from ESD protection circuits. Here, MOSFET ESD power clamps with substantial leakage reduction over previous approaches are presented. Designs are described for core logic circuits and for I/O applications where supply voltages exceed what single gate oxides can reliably sustain.

Original language	English (US)
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Publisher	ESD Association
Volume	2003-January
ISBN (Print)	1585370576, 9781585370573
State	Published - 2003
Externally published	Yes
Event	25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003 - Las Vegas, United States Duration: Sep 21 2003 → Sep 25 2003

Other

Other	25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003
Country/Territory	United States
City	Las Vegas
Period	9/21/03 → 9/25/03

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

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title = "Methods for designing low-leakage power supply clamps",

abstract = "Low power semiconductor components require minimizing leakage currents including those from ESD protection circuits. Here, MOSFET ESD power clamps with substantial leakage reduction over previous approaches are presented. Designs are described for core logic circuits and for I/O applications where supply voltages exceed what single gate oxides can reliably sustain.",

author = "Maloney, {Timothy J.} and Poon, {Steven S.}",

year = "2003",

language = "English (US)",

isbn = "1585370576",

volume = "2003-January",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

publisher = "ESD Association",

note = "25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003 ; Conference date: 21-09-2003 Through 25-09-2003",

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T1 - Methods for designing low-leakage power supply clamps

AU - Maloney, Timothy J.

AU - Poon, Steven S.

PY - 2003

Y1 - 2003

N2 - Low power semiconductor components require minimizing leakage currents including those from ESD protection circuits. Here, MOSFET ESD power clamps with substantial leakage reduction over previous approaches are presented. Designs are described for core logic circuits and for I/O applications where supply voltages exceed what single gate oxides can reliably sustain.

AB - Low power semiconductor components require minimizing leakage currents including those from ESD protection circuits. Here, MOSFET ESD power clamps with substantial leakage reduction over previous approaches are presented. Designs are described for core logic circuits and for I/O applications where supply voltages exceed what single gate oxides can reliably sustain.

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M3 - Conference contribution

SN - 1585370576

SN - 9781585370573

VL - 2003-January

BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

PB - ESD Association

T2 - 25th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2003

Y2 - 21 September 2003 through 25 September 2003

ER -

Methods for designing low-leakage power supply clamps

Abstract

Other

ASJC Scopus subject areas

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