Abstract

Fully microscopic many-body models are used to determine important material characteristics of GaAsBi and InAsBi based devices. Calculations based on the band anti-crossing (BAC) model are compared to first principle density functional theory (DFT) results. Good agreement between BAC-based results and experimental data is found for properties that are dominated by states close to the bandgap, like absorption/gain and photo luminescence. Using the BAC model for properties that involve states in the energetic region of the BAC defect level, like Auger losses and free carrier absorption results in a sharp resonance in the dependence of these quantities for Bismuth concentrations for which the bandgap becomes resonant with the spin-orbit splitting or the BAC-splitting of the light and heavy hole bands. DFT calculations show that the BAC model strongly over-simplifies the influence of the bismuth atoms on the bandstructure. Taking into account the more realistic results of DFT calculations should lead to a reduction of the sharp resonance and lead to enhancements or suppressions for other Bismuth concentrations and spectral regions.

Original languageEnglish (US)
Title of host publicationNovel In-Plane Semiconductor Lasers XV
EditorsAlexey A. Belyanin, Peter M. Smowton
PublisherSPIE
ISBN (Electronic)9781510600027
DOIs
StatePublished - 2016
EventNovel In-Plane Semiconductor Lasers XV - San Francisco, United States
Duration: Feb 15 2016Feb 18 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9767

Other

OtherNovel In-Plane Semiconductor Lasers XV
Country/TerritoryUnited States
CitySan Francisco
Period2/15/162/18/16

Keywords

  • Absorption
  • Auger losses
  • Band anti-crossing
  • Bismuth containing materials
  • Density functional theory
  • Many-body theory
  • Mid-IR materials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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