Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

Logan R. Graves; Heejoo Choi; Wenchuan Zhao; Chang J.I.N. Oh; Peng Su; Tianquan Su; Dae Wook Kim

doi:10.1364/OL.43.002110

Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

Logan R. Graves, Heejoo Choi, Wenchuan Zhao, Chang J.I.N. Oh, Peng Su, Tianquan Su, Dae Wook Kim

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.

Original language	English (US)
Pages (from-to)	2110-2113
Number of pages	4
Journal	Optics letters
Volume	43
Issue number	9
DOIs	https://doi.org/10.1364/OL.43.002110
State	Published - May 1 2018

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OL.43.002110

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title = "Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique",

abstract = "We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.",

author = "Graves, {Logan R.} and Heejoo Choi and Wenchuan Zhao and Oh, {Chang J.I.N.} and Peng Su and Tianquan Su and Kim, {Dae Wook}",

note = "Funding Information: Acknowledgment. This research was made possible in part by the II-VI Foundation Block-Gift Program, the Technology Research Initiative Fund Optics/Imaging Program, the Freeform Optics project supported by the Korea Basic Science Institute, the Friends of Tucson Optics Endowed Scholarships in Optical Sciences, and we thank Optimax Systems for providing the freeform UUT. Publisher Copyright: {\textcopyright} 2018 Optical Society of America.",

year = "2018",

month = may,

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doi = "10.1364/OL.43.002110",

language = "English (US)",

volume = "43",

pages = "2110--2113",

journal = "Optics letters",

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T1 - Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

AU - Graves, Logan R.

AU - Choi, Heejoo

AU - Zhao, Wenchuan

AU - Oh, Chang J.I.N.

AU - Su, Peng

AU - Su, Tianquan

AU - Kim, Dae Wook

N1 - Funding Information: Acknowledgment. This research was made possible in part by the II-VI Foundation Block-Gift Program, the Technology Research Initiative Fund Optics/Imaging Program, the Freeform Optics project supported by the Korea Basic Science Institute, the Friends of Tucson Optics Endowed Scholarships in Optical Sciences, and we thank Optimax Systems for providing the freeform UUT. Publisher Copyright: © 2018 Optical Society of America.

PY - 2018/5/1

Y1 - 2018/5/1

N2 - We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.

AB - We present a novel model-free iterative data-processing approach that improves surface reconstruction accuracy for deflectometry tests of unknown surfaces. This new processing method iteratively reconstructs the surface, leading to reduced error in the final reconstructed surface. The method was implemented in a deflectometry system, and a freeform surface was tested and compared to interferometric test results. The reconstructed departure from interferometric results was reduced from 15.80 μm RMS with model-based deflectometry down to 5.20 μm RMS with the iterative technique reported here.

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JO - Optics letters

JF - Optics letters

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Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

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Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique

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Model-free deflectometry for freeform optics measurement using iterative reconstruction technique

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