TY - GEN
T1 - Modeling and analysis of semiconductor manufacturing in a shrinking world
T2 - 2008 Winter Simulation Conference, WSC 2008
AU - Chien, Chen Fu
AU - Dauzère-Pérès, Stéphane
AU - Ehm, Hans
AU - Fowler, John
AU - Jiang, Zhibin
AU - Krishnaswamy, Shekar
AU - Mönch, Lars
AU - Uzsoy, Reha
PY - 2008
Y1 - 2008
N2 - A panel session on the role of modeling and analysis in semiconductor manufacturing in a shrinking world is presented. Therefore, two participants are from Asia, two from Europe, and two from US and there are two panel organizers/ moderators (Fowler and Mönch). One panelist from each continent is from industry and one from academia. Only initial position statements are included in the proceedings. However, these initial statements form the basis for the panel discussion. The statements of the panelists from industry relate to modeling and analysis problems found in their own companies. The position statements of the panelists from academia describe the role that modeling and analysis is expected to play in their current and ongoing research in semiconductor manufacturing. Furthermore, their views on the challenges and successes of modeling and analysis in a globalized world are also included.
AB - A panel session on the role of modeling and analysis in semiconductor manufacturing in a shrinking world is presented. Therefore, two participants are from Asia, two from Europe, and two from US and there are two panel organizers/ moderators (Fowler and Mönch). One panelist from each continent is from industry and one from academia. Only initial position statements are included in the proceedings. However, these initial statements form the basis for the panel discussion. The statements of the panelists from industry relate to modeling and analysis problems found in their own companies. The position statements of the panelists from academia describe the role that modeling and analysis is expected to play in their current and ongoing research in semiconductor manufacturing. Furthermore, their views on the challenges and successes of modeling and analysis in a globalized world are also included.
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U2 - 10.1109/WSC.2008.4736306
DO - 10.1109/WSC.2008.4736306
M3 - Conference contribution
SN - 9781424427086
T3 - Proceedings - Winter Simulation Conference
SP - 2093
EP - 2099
BT - Proceedings of the 2008 Winter Simulation Conference, WSC 2008
Y2 - 7 December 2008 through 10 December 2008
ER -