Abstract
The transmission electron microscope (TEM) is a powerful instrument for structural, chemical and magnetic characterization at the nanoscale. Imaging, diffraction and microanalytical information can be combined with complementary micromagnetic information to provide a more thorough understanding of magnetic behavior. The first part of this chapter provides a brief overview of TEM operating modes that are suitable for examination of magnetic materials. The latter part provides examples that serve to illustrate the diverse range of materials that can be usefully studied.
Original language | English (US) |
---|---|
Title of host publication | Advanced Magnetic Nanostructures |
Publisher | Springer US |
Pages | 119-145 |
Number of pages | 27 |
ISBN (Print) | 0387233091, 9780387233093 |
DOIs | |
State | Published - Dec 1 2006 |
ASJC Scopus subject areas
- General Physics and Astronomy