Negative differential resistance in a bilayer molecular junction

J. Le; Yan He; C. Mead; T. R. Hoye; Richard Kiehl

doi:10.1109/DRC.2003.1226921

Negative differential resistance in a bilayer molecular junction

J. Le, Yan He, C. Mead, T. R. Hoye, Richard Kiehl

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

In this paper, we report negative differential resistance in a bilayer molecular junction. The molecular junctions were formed by contacting an amino nitro benezenethiol self-assembled monolayer (SAM) supported by an gold film with a second SAM comprised of alkanethiol molecules supported on the surface of mercury drop.

Original language	English (US)
Title of host publication	Device Research Conference - Conference Digest, DRC
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	175-176
Number of pages	2
Volume	2003-January
ISBN (Print)	0780377273
DOIs	https://doi.org/10.1109/DRC.2003.1226921
State	Published - 2003
Externally published	Yes
Event	61st Device Research Conference, DRC 2003 - Salt Lake City, United States Duration: Jun 23 2003 → Jun 25 2003

Other

Other	61st Device Research Conference, DRC 2003
Country/Territory	United States
City	Salt Lake City
Period	6/23/03 → 6/25/03

Keywords

Electric resistance
Gold
Helium
Mercury (metals)
Semiconductor films
Silicon
Substrates
Temperature
Tunneling
Voltage

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/DRC.2003.1226921

Cite this

Le, J, He, Y, Mead, C, Hoye, TR & Kiehl, R 2003, Negative differential resistance in a bilayer molecular junction. in Device Research Conference - Conference Digest, DRC. vol. 2003-January, 1226921, Institute of Electrical and Electronics Engineers Inc., pp. 175-176, 61st Device Research Conference, DRC 2003, Salt Lake City, United States, 6/23/03. https://doi.org/10.1109/DRC.2003.1226921

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title = "Negative differential resistance in a bilayer molecular junction",

abstract = "In this paper, we report negative differential resistance in a bilayer molecular junction. The molecular junctions were formed by contacting an amino nitro benezenethiol self-assembled monolayer (SAM) supported by an gold film with a second SAM comprised of alkanethiol molecules supported on the surface of mercury drop.",

keywords = "Electric resistance, Gold, Helium, Mercury (metals), Semiconductor films, Silicon, Substrates, Temperature, Tunneling, Voltage",

author = "J. Le and Yan He and C. Mead and Hoye, {T. R.} and Richard Kiehl",

year = "2003",

doi = "10.1109/DRC.2003.1226921",

language = "English (US)",

isbn = "0780377273",

volume = "2003-January",

pages = "175--176",

booktitle = "Device Research Conference - Conference Digest, DRC",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "61st Device Research Conference, DRC 2003 ; Conference date: 23-06-2003 Through 25-06-2003",

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TY - GEN

T1 - Negative differential resistance in a bilayer molecular junction

AU - Le, J.

AU - He, Yan

AU - Mead, C.

AU - Hoye, T. R.

AU - Kiehl, Richard

PY - 2003

Y1 - 2003

N2 - In this paper, we report negative differential resistance in a bilayer molecular junction. The molecular junctions were formed by contacting an amino nitro benezenethiol self-assembled monolayer (SAM) supported by an gold film with a second SAM comprised of alkanethiol molecules supported on the surface of mercury drop.

AB - In this paper, we report negative differential resistance in a bilayer molecular junction. The molecular junctions were formed by contacting an amino nitro benezenethiol self-assembled monolayer (SAM) supported by an gold film with a second SAM comprised of alkanethiol molecules supported on the surface of mercury drop.

KW - Electric resistance

KW - Gold

KW - Helium

KW - Mercury (metals)

KW - Semiconductor films

KW - Silicon

KW - Substrates

KW - Temperature

KW - Tunneling

KW - Voltage

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U2 - 10.1109/DRC.2003.1226921

DO - 10.1109/DRC.2003.1226921

M3 - Conference contribution

SN - 0780377273

VL - 2003-January

SP - 175

EP - 176

BT - Device Research Conference - Conference Digest, DRC

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 61st Device Research Conference, DRC 2003

Y2 - 23 June 2003 through 25 June 2003

ER -

Negative differential resistance in a bilayer molecular junction

Abstract

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Keywords

ASJC Scopus subject areas

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