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PCB Netlist Obfuscation with Micro Electro Mechanical Systems and Additive Manufacturing Techniques

  • John True
  • , Chengjie Xi
  • , Aslam Khan
  • , Josh Hihath
  • , Navid Asadizanjani

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Semiconductor manufacturing has been outsourced to un-trusted regions due to globalization. The complex multistep fabrication of micro-scale integrated circuits (ICs) and the tedious assembly of macro-scale Printed Circuit Boards (PCBs) are vulnerable to malicious attacks from design to final delivery. PCBs provide the functional connections of Integrated Circuits (ICs), sensors, power supplies, etc. of many critical electronic systems for consumers, corporations, and governments. The feature sizes of PCB signal traces in 2D and vias in 3D are an order of magnitude larger than IC devices, and are thereby more vulnerable to non-destructive attacks such as X-ray or probing. Active and passive countermeasures have been successfully developed for IC devices, however PCBs devices are difficult to wholly secure from all attacks. Passive countermeasures for X-ray attacks using high-z materials to block and scatter X-rays are effective, but there is a lack of active and passive countermeasures for PCB. In this paper, a framework for passively obfuscating a PCB’s critical connections between components, such as ICs, from non-destructive attacks is demonstrated. This framework can be further extended to incorporate active countermeasures in future work. A proof of concept for a PCB electronic design automation (EDA) tool which combines the small features of micro electro-mechanical systems (MEMS), simulation of X-ray, and 3D PCB Manufacturing to iteratively optimize PCB design to thwart reverse engineering and probing attacks.

Original languageEnglish (US)
Title of host publicationISTFA 2021
Subtitle of host publicationProceedings from the 47th International Symposium for Testing and Failure Analysis Conference
PublisherASM International
Pages172-178
Number of pages7
ISBN (Electronic)9781627084215
DOIs
StatePublished - 2021
Externally publishedYes
Event47th International Symposium for Testing and Failure Analysis Conference, ISTFA 2021 - Phoenix, United States
Duration: Oct 31 2021 → Nov 4 2021

Publication series

NameConference Proceedings from the International Symposium for Testing and Failure Analysis
Volume2021-October

Conference

Conference47th International Symposium for Testing and Failure Analysis Conference, ISTFA 2021
Country/TerritoryUnited States
CityPhoenix
Period10/31/21 → 11/4/21

Keywords

  • Additive Manufacturing
  • Hardware Assurance
  • MEMS
  • Non-Destructive Technology
  • Physical Inspection

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Safety, Risk, Reliability and Quality

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