TY - GEN
T1 - Post-production adaptation of RF circuits for application-specific performance metrics
AU - Chang, Doohwang
AU - Kitchen, Jennifer
AU - Ozev, Sule
N1 - Publisher Copyright: © 2016 IEEE.
PY - 2016/7/29
Y1 - 2016/7/29
N2 - Wireless Revolution V.2 in the form of Internet of Things (IoT) necessitates development of RF on rapidly evolving manufacturing processes using a small team of engineers. These processing nodes are tuned for digital performance and typically present with higher process variations. Manufactured RF devices either need to include larger margins to guarantee performance or be tuned post-manufacture to recover the performance. In this paper, we present a set of design principles for RF devices that can be adapted post-production for specific needs of the target application. Post-production tuning lifts the design burden from engineering efforts to measurement and calibration at the production test time.
AB - Wireless Revolution V.2 in the form of Internet of Things (IoT) necessitates development of RF on rapidly evolving manufacturing processes using a small team of engineers. These processing nodes are tuned for digital performance and typically present with higher process variations. Manufactured RF devices either need to include larger margins to guarantee performance or be tuned post-manufacture to recover the performance. In this paper, we present a set of design principles for RF devices that can be adapted post-production for specific needs of the target application. Post-production tuning lifts the design burden from engineering efforts to measurement and calibration at the production test time.
KW - RF performance tuning
KW - built-in calibration
UR - http://www.scopus.com/inward/record.url?scp=84983392055&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84983392055&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2016.7539168
DO - 10.1109/ISCAS.2016.7539168
M3 - Conference contribution
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 2775
EP - 2778
BT - ISCAS 2016 - IEEE International Symposium on Circuits and Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016
Y2 - 22 May 2016 through 25 May 2016
ER -