Skip to main navigation Skip to search Skip to main content

Process variation model and analysis for domain wall-magnetic tunnel junction logic

  • Xuan Hu
  • , Alexander J. Edwards
  • , T. Patrick Xiao
  • , Christopher H. Bennett
  • , Jean Anne C. Incorvia
  • , Matthew J. Marinella
  • , Joseph S. Friedman

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The domain wall-magnetic tunnel junction (DW-MTJ) is a spintronic device that enables efficient logic circuit design because of its low energy consumption, small size, and non-volatility. Furthermore, the DW-MTJ is one of the few spintronic devices for which a direct cascading mechanism is experimentally demonstrated without any extra buffers; this enables potential design and fabrication of a large-scale DW-MTJ logic system. However, DW-MTJ logic relies on the conversion between electrical signals and magnetic states which is sensitive to process imperfection. Therefore, it is important to analyze the robustness of such DW-MTJ devices to anticipate the system reliability before fabrication. Here we propose a new DW-MTJ model that integrates the impacts of process variation to enable the analysis and optimization of DW-MTJ logic. This will allow circuit and device design that enhances the robustness of DW-MTJ logic and advances the development of energy-efficient spintronic computing systems.

Original languageEnglish (US)
Title of host publication2020 IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728133201
StatePublished - 2020
Externally publishedYes
Event52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020 - Virtual, Online
Duration: Oct 10 2020 → Oct 21 2020

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2020-October

Conference

Conference52nd IEEE International Symposium on Circuits and Systems, ISCAS 2020
CityVirtual, Online
Period10/10/20 → 10/21/20

Keywords

  • Device model
  • Domain wall
  • Magnetic tunnel junction
  • Process variation
  • Spintronic logic

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Process variation model and analysis for domain wall-magnetic tunnel junction logic'. Together they form a unique fingerprint.

Cite this