Quality assessment of quasi-phase-matched gratings by Gaussian beam diffraction

Prashant Povel Dwivedi, Ch S.S.Pavan Kumar, Hee Joo Choi, Myoungsik Cha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Random duty-cycle error is genetic in quasi-phase matched gratings. An estimate of this error is significant to avoid parasitic harmonic generation. This study highlights an advantageous, high resolution method to quantitatively assess the gratings centered on Gaussian beam diffraction.

Original languageEnglish (US)
Title of host publication2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467371094
DOIs
StatePublished - Jan 7 2016
Externally publishedYes
Event11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 - Busan, Korea, Republic of
Duration: Aug 24 2015Aug 28 2015

Publication series

Name2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Volume1

Other

Other11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Country/TerritoryKorea, Republic of
CityBusan
Period8/24/158/28/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Fingerprint

Dive into the research topics of 'Quality assessment of quasi-phase-matched gratings by Gaussian beam diffraction'. Together they form a unique fingerprint.

Cite this