Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits
- Jereme Neuendank
- , Matthew Spear
- , Trace Wallace
- , Donald Wilson
- , Jose Solano
- , Gedeon Irumva
- , Ivan Sanchez Esqueda
- , Hugh J. Barnaby
- , John Brunhaver
- , Marek Turowski
- , Esko Mikkola
- , David Hughart
- , Joshua Young
- , Jack Manuel
- , Sapan Agarwal
- , Bastiaan Vaandrager
- , Gyorgy Vizkelethy
- , Amos Gutierrez
- , James Trippe
- , Michael King
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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