Study of trap levels in β-Ga ₂ O ₃ by thermoluminescence spectroscopy

Electronic defects with shallow and deep levels in β-Ga ₂ O ₃ single crystals were investigated by thermoluminescence (TL) spectroscopy. Undoped, Fe-doped, Sn-doped, and Mg-doped β-Ga ₂ O ₃ single crystals grown by different methods were studied, and thermal activation energies of defects were calculated using the initial rise method. Hall-effect measurements and optical absorption spectroscopy were performed to determine the electrical transport properties and optical bandgaps. It was found that the dopants do not have any effect on the bandgap energy, which is important for comparing the trap levels in the samples. Three deep trap levels were found in the undoped crystals; the activation energy, E _D , and concentration of defect centers for all of them have slightly changed after doping with Fe and Mg. Fe doping induced an additional defect center with activation energy of 0.62 eV. The measurements revealed the absence of TL emission in Sn doped crystals indicating that Sn doping may quench luminescence centers or modified some original electronic defects to inactive electron traps. The second interpretation "decrease of traps" may align with the successful incorporation of Sn as a donor and the high conductivity of Sn doped crystals revealed from Hall-effect measurements. This work also illustrates that the semi-insulating characteristics of Fe and Mg doped Ga ₂ O ₃ are associated with the increase of the concentration of original traps in the crystal as well as the formation of new electron traps acting as deep acceptors. Recombination centers in all crystals are assumed to be associated with iron impurities.