TY - JOUR
T1 - Temperature dependent chemical ordering in FePt(001) and FePt(110) films
AU - Schwickert, M. M.
AU - Hannibal, K. A.
AU - Toney, M. F.
AU - Best, M.
AU - Folks, L.
AU - Thiele, J. U.
AU - Kellock, A. J.
AU - Weller, D.
PY - 2000/5/1
Y1 - 2000/5/1
N2 - The growth temperature is one of the critical parameters in the formation of the chemically ordered L10 phase in FePt. To uniquely determine the influence of growth temperature, while other growth parameters remain fixed, we present the "temperature wedge method" where a calibrated temperature gradient of several hundred Kelvin is established across the substrate during co-deposition of Fe and Pt. Samples were deposited in a temperature range of 250°C-600°C simultaneously on MgO(001) and MgO(110) substrates. The Fe≈50Pt≈50 composition was verified by Rutherford backscattering. The chemical order parameter, S, at different positions along the samples, i.e., at different growth temperatures, was determined by x-ray diffraction measurements, and it was found that at all temperatures S(001) > S(110). Perpendicular and in-plane magneto-optic Kerr hysteresis loop measurements indicate large magnetic anisotropy at the "hot ends" of the samples, corresponding to large values of S.
AB - The growth temperature is one of the critical parameters in the formation of the chemically ordered L10 phase in FePt. To uniquely determine the influence of growth temperature, while other growth parameters remain fixed, we present the "temperature wedge method" where a calibrated temperature gradient of several hundred Kelvin is established across the substrate during co-deposition of Fe and Pt. Samples were deposited in a temperature range of 250°C-600°C simultaneously on MgO(001) and MgO(110) substrates. The Fe≈50Pt≈50 composition was verified by Rutherford backscattering. The chemical order parameter, S, at different positions along the samples, i.e., at different growth temperatures, was determined by x-ray diffraction measurements, and it was found that at all temperatures S(001) > S(110). Perpendicular and in-plane magneto-optic Kerr hysteresis loop measurements indicate large magnetic anisotropy at the "hot ends" of the samples, corresponding to large values of S.
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U2 - https://doi.org/10.1063/1.372898
DO - https://doi.org/10.1063/1.372898
M3 - Conference article
SN - 0021-8979
VL - 87
SP - 6956
EP - 6958
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 9 III
T2 - 44th Annual Conference on Magnetism and Magnetic Materials
Y2 - 15 November 1999 through 18 November 1999
ER -