Abstract
We explore the effect of expected deviations from ideal components of microgrid imaging polarimeters using simulation and perform a calibration on an implementation of these errors from data taken by a specific instrument.
| Original language | English (US) |
|---|---|
| Journal | Optics InfoBase Conference Papers |
| State | Published - 2010 |
| Event | Frontiers in Optics, FiO 2010 - Rochester, NY, United States Duration: Oct 24 2010 → Oct 28 2010 |
ASJC Scopus subject areas
- Instrumentation
- Atomic and Molecular Physics, and Optics